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Level Level 2

Note: Meets CSS Level 3. W3C has not released the full specification for this level.

Valid HTML 4.01 Transitional

Note: To be updated to meet W3C HTML 5.0 when 5.0 is released - late 2010 or early 2011.


  • Over 35 years in manufacturing and test. Industries include semiconductors (both fabless and fab), "light electronics," aerospace, consumer electronics, publishing
  • Clients include IBM, Texas Instruments, Motorola, Advanced Micro Devices, KLA Instruments, Applied Materials, Tracor Aerospace, Lockheed Missiles and Space Company/Lockheed-Martin, National Semiconductor, Samsung, Hyundai, Dell Computers, Hewett Associates, SC Johnson, and others.
  • Developed and conducted training classes in basic electronics, dc parametric testing and test methodology, and computer applications
  • Wrote, edited, and published technical documentation (such as users' manuals, installation manuals, and applications notes/white papers), public relations material, and newsletters
  • Created guides for program management procedures, capital appropriations, and company specific software procedures
  • Developed Design-to-Cost, Design-to-Quality, and Value Engineering procedures
  • Created computerized on-line troubleshooting guides for wafer fab processes
  • Managed failure analysis lab for consumer products and semiconductor industry
  • Created math models for manufacturing and test simulations
  • Developed return-rate failure models used for customer repair forecasting
  • Established calibration procedures and metrology guidelines for general electronics test equipment and semiconductor monitoring equipment


  • Contributing author, edited by Publishers' Resource Group, Chemistry: Connections To Our Changing world, Prentice Hall
  • Hauenstein, L. R., edited by Dr. Kash Mittal, Cosmetics as a Possible Source of Particulate Contamination, PARTICLES IN GASES AND LIQUIDS: DETECTION AND CONTROL, Plenum Press, New York, NY
  • Hauenstein, L. R., Cosmetics in the Clean Room: Is it a Problem?, Cleanrooms
  • Hauenstein, L. R., Theory of Optical Cross Sections of Deep Level Impurities in Covalently Bonded Semiconductors, Texas Tech University Press, Lubbock, TX
  • Hauenstein, L. R., Isolating and Controlling ESD Contamination in Wafer Fabs, paper/presentation at the quarterly worldwide contamination seminar held at Motorola, Austin, TX
  • Hauenstein, L. R., Contamination Control Procedures, paper/presentation at the quarterly worldwide contamination control seminar held at Motorola, Phoenix, AZ
  • Hauenstein, L. R., Cash Flow Analysis, self published
  • Hauenstein, L. R., Developing Standard Times, self published
  • Hauenstein, L. R., Reliability Models, paper and presentation sponsored by the ACCA (Association of Colleges in the Chicago Area) held at Elmhurst College, Elmhurst, IL


  • Senior member of the Austin (TX) Chapter of the Institute of Industrial Engineers (past president)
  • Member of the Austin Writers' League and San Gabriel Writers' League
  • Lake County Chamber of Commerce
  • Society for Technical Communications
  • Registered Professional Engineer (Texas), #60012
  • MS in Applied Physics, Texas Tech University, Lubbock, TX
    • Thesis: Theory of Optical Cross Sections of Deep Level Impurities in Covalently Bonded Semiconductors
  • BS in Industrial Engineering, Texas Tech University, Lubbock, TX
  • Web Master Certificate (Programming/Design Graphics/Data Base), Austin Community College, Austin, TX
  • Localization/Globalization Certificate, Austin Community College, Austin, TX
  • AA in Technical Communications, DeAnza College, Cupertino, CA
  • Associate of Applied Science in Electronics Engineering Technology, DeVry University, Chicago, IL